Title :
Development of quantum functional devices for multiple-valued logic circuits
Author_Institution :
Fundamental Res. Labs., NEC Corp., Ibaraki, Japan
Abstract :
Quantum functional devices exhibiting unique current-voltage characteristics are reported for the application of multiple-valued logic circuits. Multiple negative-differential-resistance (NDR) characteristics in drain current-voltage characteristics are demonstrated by using multiple-junction surface tunnel transistors (MJ-STTs). Some multiple-valued logic gates such as inverter and literal are implemented using the MJ-STTs. Oscillatory characteristics of drain current under gate modulation are shown by single electron transistors. Nonvolatile multiple-valued memory devices utilizing these unique characteristics are described, and the fundamental operation of write and read of stored electrons are demonstrated
Keywords :
multivalued logic circuits; quantum gates; tunnel transistors; MJ-STTs; drain current under gate modulation; drain current-voltage characteristics; inverter; literal; multiple-junction surface tunnel transistors; multiple-valued logic circuits; multiple-valued logic gates; negative-differential-resistance; quantum functional devices; Energy consumption; Logic circuits; Logic devices; MOSFETs; National electric code; Quality function deployment; Rain; Single electron transistors; Ultra large scale integration; Voltage;
Conference_Titel :
Multiple-Valued Logic, 1999. Proceedings. 1999 29th IEEE International Symposium on
Conference_Location :
Freiburg
Print_ISBN :
0-7695-0161-3
DOI :
10.1109/ISMVL.1999.779687