Title :
GHz RF front-end bandwidth time domain measurement
Author :
Wang, Qi ; Tang, Yi ; Soma, Mani
Author_Institution :
Washington Univ., Seattle, WA, USA
Abstract :
This paper proposes a method and an on-chip test circuit to measure the center frequency and the bandwidth of RF front-end circuits using the peak amplitudes and the periods of the output signal in response to a realistic step input signal. The method is also suitable for implementation in external test instrumentation.
Keywords :
radiofrequency integrated circuits; time-domain analysis; RF front end bandwidth time domain measurement; RF front end circuits; center frequency measurement; external test instrumentation; on-chip test circuit; realistic step input signal; signal amplitude; Analytical models; Bandwidth; Circuit testing; Costs; Frequency domain analysis; Radio frequency; Spectral analysis; System testing; Time domain analysis; Time measurement;
Conference_Titel :
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
Print_ISBN :
0-7695-2134-7
DOI :
10.1109/VTEST.2004.1299247
