DocumentCode :
2993773
Title :
Cost-driven selection of parity trees
Author :
Almukhaizim, Sobeeh ; Drineas, Petros ; Makris, Yiorgos
Author_Institution :
Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
fYear :
2004
fDate :
25-29 April 2004
Firstpage :
319
Lastpage :
324
Abstract :
We discuss the problem of parity tree selection for lossless compaction of the output responses of a circuit. Earlier methods assume off-chip storage of the correct compacted responses and therefore minimize the number of necessary parity trees. In contrast, our method targets on-chip generation of the correct compacted responses and therefore minimizes the actual implementation cost of the corresponding parity prediction functions. We present a systematic search approach that exploits the correlation between the hardware cost of a function and its entropy, in order to select parity trees that minimize the incurred cost, while achieving lossless compaction. Experimental results demonstrate that our method achieves significant hardware reduction over methods that minimize the number of parity trees.
Keywords :
Monte Carlo methods; entropy codes; integer programming; linear programming; parity check codes; Monte Carlo methods; circuit output responses; cost driven selection; cost minimisation; entropy; hardware cost; hardware reduction; integer linear programming; lossless compaction; off-chip storage; on-chip generation; parity prediction functions; parity tree selection; Circuit faults; Compaction; Computer science; Cost function; Entropy; Hardware; Integer linear programming; Minimization methods; Optimization methods; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
ISSN :
1093-0167
Print_ISBN :
0-7695-2134-7
Type :
conf
DOI :
10.1109/VTEST.2004.1299259
Filename :
1299259
Link To Document :
بازگشت