Title :
Partial detectability profiles
Author :
Ryan, P.G. ; Fuchs, W.K.
Author_Institution :
Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
Abstract :
Partial detectability profiles are introduced for estimating the fault coverage of random pattern input vectors. Partial profiles are justified mathematically, and the relationship between sample size and error introduced is quantified. The results of circuit simulations are presented, illustrating the accuracy of estimates based on partial detectability profiles. The reason for use of partial profiles instead of full profiles is that they do not require fault simulation over all possible input vectors. Similarly, the advantage partial profiling has over simulating a few random faults for all input vectors is that the number of possible input vectors often becomes prohibitive before the number of faults in very large circuits. Another interesting application is to use partial profiles to determine which faults have the lowest detectabilities.<>
Keywords :
circuit analysis computing; fault location; circuit simulations; fault coverage; fault simulation; partial detectability profiles; random pattern input vectors; sample size; Circuit faults; Circuit simulation; Circuit testing; Closed-form solution; Combinational circuits; Computational modeling; Electrical fault detection; Fault detection; Sampling methods; Semiconductor device testing;
Conference_Titel :
Computer-Aided Design, 1990. ICCAD-90. Digest of Technical Papers., 1990 IEEE International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-2055-2
DOI :
10.1109/ICCAD.1990.129928