• DocumentCode
    299658
  • Title

    EVA, CVA and PVA-the quality metrics for the 1990´s

  • Author

    Fuchs, Edward ; Wyndrum, Ralph W., Jr.

  • Author_Institution
    AT&T Bell Labs., Holmdel, NJ, USA
  • Volume
    2
  • fYear
    1995
  • fDate
    18-22 Jun 1995
  • Firstpage
    1095
  • Abstract
    For maximum effectiveness, total quality management (TQM) paradigms must be aligned with strategic business directions and plans. However, to date, few entities have exhibited the powerful performance that comes with achievement of such alignment. While total quality approaches that emphasize such metrics as cost of quality and six sigma have had significant impacts in some companies, their roles are limited by the inability to find strong correlations between these measures and long or short-term business results. Relationships are masked by the confounding effects of all of the other changes-technological, economic, and competitive-that take place concurrent with TQM. This paper addresses key elements of the issue of forging a total quality approach that is aligned with an entity´s strategic intent. Key elements of this approach are new performance and quality metrics that provide instrumentation for the approach, in parameters that are aligned with the dimensions of business success. We describe the roles that such metrics play. We provide brief technical descriptions of three such “umbrella” metrics-economic value added(EVA), customer value added (CVA) and people value added (PVA) and discuss the experience to date with their implementation and operation
  • Keywords
    commerce; economics; management; quality control; AT&T; CVA; EVA; PVA; TQM; business plans; cost of quality; customer satisfaction; customer value added; economic performance; economic value added; people value added; performance metrics; quality metrics; six sigma; strategic business directions; total quality approach; total quality management; Acceleration; Art; Companies; Costs; Management training; Manufacturing; Productivity; Quality management; Technological innovation; Total quality management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, 1995. ICC '95 Seattle, 'Gateway to Globalization', 1995 IEEE International Conference on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    0-7803-2486-2
  • Type

    conf

  • DOI
    10.1109/ICC.1995.524270
  • Filename
    524270