Abstract :
The following topics are dealt with: advanced memory circuits and special circuit techniques, multigate devices and manufacturing, power delivery, packaging and PCB technology, low-power and noise-aware design innovations, noise, reliability, and variability; nano and bio electronics innovations; photovoltaic technology & manufacturing including display systems; analog and low power test; miscellaneous design topics; CMOS imagers and data converters; physical and system design, advanced topics in design; semiconductor technology & manufacturing; and test & verification such as fault diagnosis.
Keywords :
CMOS image sensors; analogue integrated circuits; data conversion; display instrumentation; fault diagnosis; integrated circuit design; integrated circuit manufacture; integrated circuit noise; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; integrated memory circuits; low-power electronics; nanoelectronics; printed circuits; semiconductor device manufacture; semiconductor device models; semiconductor storage; CMOS imagers; PCB technology; advanced memory circuits; analog test; bioelectronics; data converters; low power test; low-power innovations; multigate device manufacturing; nanoelectronics; noise-aware design innovations; packaging; photovoltaic manufacturing; photovoltaic technology; physical design; power delivery; reliability; semiconductor manufacturing; semiconductor technology; special circuit techniques; system design; variability; verification;
