Title :
A wafer scale DTW multiprocessor
Author :
Mann, J.R. ; Rhodes, F.M.
Author_Institution :
Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, Massachusetts, USA
Keywords :
Costs; Dynamic programming; Laboratories; Laser beam cutting; Nonlinear dynamical systems; Partitioning algorithms; Speech recognition; Testing; Very large scale integration; Wafer scale integration;
Conference_Titel :
Acoustics, Speech, and Signal Processing, IEEE International Conference on ICASSP '86.
Conference_Location :
Tokyo, Japan
DOI :
10.1109/ICASSP.1986.1168662
