Title :
Highly area efficient and cost effective double stacked S3 (stacked single-crystal Si) peripheral CMOS SSTFT and SRAM cell technology for 512M bit density SRAM
Author :
Jung, Soon-Moon ; Lim, Hoon ; Cho, Wonseok ; Cho, Hoosung ; Yeo, Chadong ; Kan, Yongha ; Bae, Daegi ; Na, Jonghoon ; Kwak, Kunho ; Choi, Bonghyun ; Kim, Sungjin ; Jeon, Jaehun ; Chang, Youngchu ; Jang, Jaehoon ; Kim, Jonghyuk ; Kim, Kinam ; Ryu, Byung-Il
Author_Institution :
R&D Center, Samsung Electron., Yongin, South Korea
Abstract :
For the first time, the highest density SRAM, such as 512M bit SRAM, is developed by implementing the smallest 25F2S3 SRAM cell technology, whose cell size is 0.16μm2, and area saving peripheral SSTFT (stacked single-crystal thin film transistor) technology. The SSTFT are used as the peripheral CMOS transistors as well as the cell transistors to save area to make the SRAM products comparative to the DRAM cell based products in the density and the cost. In the S3 SRAM cell, the load PMOS and pass NMOS transistors are stacked over the planar pull-down NMOS transistors to drastically reduce the cell size. Also, in a periphery, the core logic transistors are stacked on the ILD to save the layout area for maximizing cell efficiency for the products.
Keywords :
CMOS integrated circuits; MOSFET; SRAM chips; integrated circuit layout; logic devices; silicon; thin film transistors; 512 Mbit; CMOS transistors; DRAM cell based products; SRAM cell technology; Si; cell size reduction; cell transistors; core logic transistors; double stacked peripheral CMOS SSTFT; layout area; load PMOS transistors; pass NMOS transistors; planar pull-down NMOS transistors; stacked single-crystal Si; stacked single-crystal thin film transistor; CMOS logic circuits; CMOS technology; Costs; Fabrication; Implants; MOSFETs; Random access memory; Research and development; Space technology; Thin film transistors;
Conference_Titel :
Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International
Print_ISBN :
0-7803-8684-1
DOI :
10.1109/IEDM.2004.1419128