DocumentCode
3000536
Title
Test program development in VLSI testing
Author
Wong, Mike W T ; Cheung, K.T.
Author_Institution
Dept. of Electron. Eng., Hong Kong Polytech. Univ., Kowloon, Hong Kong
Volume
4
fYear
1997
fDate
9-12 Jun 1997
Firstpage
2697
Abstract
This paper describes how an automatic test program generation environment is developed by making use of the Summit Design´s TDS software modules as the basic building blocks. A new design-to-test process flow is defined. A solution of eliminating conversion errors of simulation post-processing is also proposed. In this approach, a functional test program can be generated within minutes, which dramatically shortens the test program development time and gets a new product faster to market
Keywords
CAD/CAM; VLSI; automatic testing; design for testability; digital simulation; integrated circuit testing; Summit Design; TDS software modules; VLSI testing; automatic test program generation environment; conversion errors; design-to-test process flow; functional test program; simulation post-processing; Analytical models; Automatic test pattern generation; Automatic testing; Data analysis; Databases; Intrusion detection; Process design; Software design; Software testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1997. ISCAS '97., Proceedings of 1997 IEEE International Symposium on
Print_ISBN
0-7803-3583-X
Type
conf
DOI
10.1109/ISCAS.1997.612881
Filename
612881
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