DocumentCode
3000669
Title
A Fault-aware Sensor Architecture for Cooperative Mobile Applications
Author
Kaiser, Jörg ; Zug, Sebastian
Author_Institution
Dept. for Distrib. Syst., Univ. Magdeburg, Magdeburg, Germany
fYear
2012
fDate
21-25 May 2012
Firstpage
1512
Lastpage
1519
Abstract
One of the striking characteristics of mobile embedded systems is the interaction with the physical world. Prerequisite for this interaction is the reliable perception of the environment by sensors. Exploiting remote sensors of an instrumented environment and other mobile systems will extend the range and modalities of sensing and, in principle, will contribute to a better environment perception. However, such as distributed sensor system also puts new substantial challenges on the assessment and dynamic use of sensor data. This paper focus on dependability issues and presents a fault abstraction and fault-handling concept, that encapsulates individual sensor faults and encourages multi-level fault detection. Based on an analysis of sensor faults, our approach generates a validation for each sensor measurement. This allows assessing remote sensor data quality in a uniform way and provides the basis for a distributed mobile application in which new sensor sources can be discovered and exploited dynamically.
Keywords
distributed sensors; fault diagnosis; intelligent sensors; cooperative mobile application; dependability; distributed mobile application; distributed sensor system; environment perception; fault abstraction; fault handling concept; fault-aware sensor architecture; mobile embedded system; mobile system; multilevel fault detection; reliable perception; remote sensor data quality; remote sensors; sensor faults; sensor measurement; striking characteristics; Fault tolerant systems; Indexes; Intelligent sensors; Mobile communication; Redundancy; Robot sensing systems; Distributed application; Fault abstraction; Fault detection; Fault model; Smart sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Parallel and Distributed Processing Symposium Workshops & PhD Forum (IPDPSW), 2012 IEEE 26th International
Conference_Location
Shanghai
Print_ISBN
978-1-4673-0974-5
Type
conf
DOI
10.1109/IPDPSW.2012.190
Filename
6270821
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