DocumentCode
3000785
Title
Three Bio-Inspired Approaches to Telecommunications Defect-Tracking and Reliability-Estimation
Author
Abdel-Aty-Zohdy, Hoda S. ; Sherif, Mostafa Hashem ; Smiarowski, Adam, Jr.
Author_Institution
Microelectron. Syst. Design Lab., Oakland Univ. Electr. & Comput. Eng., Rochester, MI
Volume
2
fYear
2006
fDate
6-9 Aug. 2006
Firstpage
542
Lastpage
546
Abstract
Three alternative bio-inspired approaches are proposed to investigate telecommunication system reliability and defect tracking. They employ a recent model for the failure discovery in the associated system software. These are: half-sibling and a clone (HSAC) genetic algorithm; a recurrent dynamic neural network (RDNN) requiring parametric adjustments and using wavelets as basis; another RDNN with Adaptive parameters to incoming stream of input data, such that the error in failure intensity is minimized, subject to the model constraints. Each approach aims to improve speed of convergence, reliability, noise tolerance, and suitability for hardware implementation. Simulation results seem to favor the ARDNN since it iterates (about 10) on the shape of the wavelet basis and provide adequate recovery of the data in the form of piecewise linear differential.
Keywords
convergence of numerical methods; failure analysis; genetic algorithms; iterative methods; piecewise linear techniques; recurrent neural nets; risk management; telecommunication computing; telecommunication network reliability; wavelet transforms; adaptive parameters; bio-inspired approaches; failure discovery; failure intensity; half-sibling-and-clone genetic algorithm; hardware implementation; iteration; noise tolerance; piecewise linear differential form; recurrent dynamic neural network; speed of convergence; system software; telecommunications defect-tracking; telecommunications reliability-estimation; wavelet basis; Cloning; Convergence; Genetic algorithms; Hardware; Neural networks; Noise shaping; Recurrent neural networks; Shape; System software; Telecommunication network reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2006. MWSCAS '06. 49th IEEE International Midwest Symposium on
Conference_Location
San Juan
ISSN
1548-3746
Print_ISBN
1-4244-0172-0
Electronic_ISBN
1548-3746
Type
conf
DOI
10.1109/MWSCAS.2006.381787
Filename
4267411
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