DocumentCode :
3001080
Title :
Automatic Refinement of Parallel Applications Structure Detection
Author :
Gonzalez, Juan ; Huck, Kevin ; Gimenez, Judit ; Labarta, Jesus
Author_Institution :
Barcelona Supercomput. Center, Univ. Politec. de Catalunya - Barcelona Tech, Barcelona, Spain
fYear :
2012
fDate :
21-25 May 2012
Firstpage :
1680
Lastpage :
1687
Abstract :
Analyzing parallel programs has become increasingly difficult due to the immense amount of information collected on large systems. In this scenario, cluster analysis has been proved to be a useful technique to reduce the amount of data to analyze. A good example is the use of the density-based cluster algorithm DBSCAN to identify similar single program multiple data (SPMD) computing phases in message-passing applications. This structure detection simplifies the analyst work as the whole information available is reduced to a small set of clusters. However, DBSCAN presents two major problems: it is very sensitive to its parametrization and is not capable of correctly detect clusters when the data set has different densities across the data space. In this paper, we introduce the Aggregative Cluster Refinement, an iterative algorithm that produces more accurate structure detections of SPMD phases than DBSCAN. In addition, it is able to detect clusters with different densities.
Keywords :
data analysis; iterative methods; message passing; parallel programming; pattern clustering; DBSCAN; SPMD computing; aggregative cluster refinement; automatic refinement; cluster analysis; data analysis; density-based cluster algorithm; information collection; iterative algorithm; message passing; parallel programs; single program multiple data computing; structure detection; Algorithm design and analysis; Benchmark testing; Clustering algorithms; Hardware; Manuals; Partitioning algorithms; Radiation detectors; automatic analysis; cluster analysis; data mining; parallel applications; performance analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Parallel and Distributed Processing Symposium Workshops & PhD Forum (IPDPSW), 2012 IEEE 26th International
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-0974-5
Type :
conf
DOI :
10.1109/IPDPSW.2012.209
Filename :
6270842
Link To Document :
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