Title :
Lower bounds on energy dissipation and noise-tolerance for deep submicron VLSI
Author :
Hegde, Rajamohana ; Shanbhag, Naresh R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Abstract :
In this paper, we obtain the lower bounds on total energy dissipation of deep submicron (DSM) VLSI circuits via an information-theoretic framework. This framework enables the derivation of lower bounds under the constraint of reliable operation in presence of DSM noise. We employ noise-tolerance via coding to approach the lower bounds on energy dissipation. It is shown that the lower bounds on energy for an off-chip I/O signaling example are a factor of 24X below present day systems. It is also shown that reduction in energy consumption by a factor of 4X can be obtained by employing Reed-Muller codes to achieve the desired bit-error-rate (BER) in presence of DSM noise
Keywords :
Reed-Muller codes; VLSI; integrated circuit noise; low-power electronics; Reed-Muller code; bit error rate; deep submicron VLSI circuit; energy dissipation; information theory; noise tolerance; off-chip I/O signal; reliability; Bit error rate; Circuit noise; Costs; Energy consumption; Energy dissipation; Entropy; Laboratories; Noise reduction; Semiconductor device noise; Very large scale integration;
Conference_Titel :
Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-5471-0
DOI :
10.1109/ISCAS.1999.780163
