Title :
Reliability driven module generation for analog layouts
Author :
Wolf, M. ; Kleine, U.
Author_Institution :
Inst. for Meas. Technol. & Electron., Otto-von-Guericke-Univ. of Magdeburg, Germany
Abstract :
In this paper new features of a module generator environment will be presented for reliability improvements in analog circuit layouts. The reliability of analog layouts is improved by an automatic check of electrical constraints like electromigration and voltage drop due to interconnection resistances after the modules have been generated. If a check failed constraints are automatically added and the layout is automatically rebuilt. The new features will be demonstrated with several layout examples
Keywords :
analogue integrated circuits; electromigration; integrated circuit interconnections; integrated circuit layout; integrated circuit reliability; analog circuit layout; automatic check; electrical properties; electromigration; interconnection resistance; module generation; reliability; voltage drop; Circuits; Conductors; DC generators; Electromigration; Frequency; Optimization; Parasitic capacitance; Performance evaluation; Process design; Voltage;
Conference_Titel :
Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-5471-0
DOI :
10.1109/ISCAS.1999.780182
