DocumentCode
3002154
Title
Reliability analysis of warm standby systems using sequential BDD
Author
Tannous, Ola ; Xing, Liudong ; Dugan, Joanne Bechta
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Massachusetts (UMass), Dartmouth, MA, USA
fYear
2011
fDate
24-27 Jan. 2011
Firstpage
1
Lastpage
7
Abstract
Warm standby sparing is a fault-tolerant design technique developed as a compromise between cold sparing and hot sparing approaches in terms of power consumption and recovery time. Warm spares have time-dependent failure behavior; before and after they are used to replace a faulty component, warm spares have different failure rates or in general failure distributions. Existing approaches for analyzing systems with warm spares typically require long computation time especially when results with high degree of accuracy are desired, and/or require exponential time-to-failure distribution for system components. In this paper, an analytical method is proposed for the reliability analysis of warm standby sparing systems. The proposed approach is based on the combinatorial model of sequential binary decision diagrams, and can generate accurate system reliability results for large systems. The approach is applicable to any type of time-to-failure distributions for the system components. Application and advantages of the proposed approach are illustrated using several examples.
Keywords
binary decision diagrams; fault trees; cold sparing; fault tolerant design; hot sparing; power consumption; recovery time; reliability analysis; sequential BDD; sequential binary decision diagram; system component; time-dependent failure behavior; time-to-failure distribution; warm standby sparing system; Boolean functions; Computational modeling; Data structures; Fault trees; Logic gates; Markov processes; Reliability; dynamic fault tree (DFT); sequential binary decision diagram (SBDD); warm spare;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
Conference_Location
Lake Buena Vista, FL
ISSN
0149-144X
Print_ISBN
978-1-4244-8857-5
Type
conf
DOI
10.1109/RAMS.2011.5754426
Filename
5754426
Link To Document