• DocumentCode
    3002736
  • Title

    Condition recognition of complex systems based on multi-fractal analysis

  • Author

    Lui, Yanqing ; Gao, Jianmin ; Jiang, Hongquan ; Chen, Kun

  • Author_Institution
    State Key Lab. for Manuf. Syst. Eng., Xi´´an Jiaotong Univ., Xian, China
  • fYear
    2011
  • fDate
    24-27 Jan. 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Multifractal analysis is applied to extract nonlinear features from complex systems for condition recognition. Abnormal condition is hazardous for process industry complex system which may lead to accidents. Comparing with traditional techniques of condition recognition without concerning nonlinearity of complex system, multifractal spectrum elaborately reveals scale-invariance or self-similarity pro perties of observed data, which is one of the intrinsic characteristics of complex system. By using Multifractal Detrended Fluctuation Analysis (MF-DFA) algorithm, multifractal spectrum is calculated directly from monitoring time series data. The shape of multifractal spectrum is used to distinguish abnormal conditions from normal ones of complex system. After multi-source information fusion based on Dempster-Shafer evidence theory, the proposed approach can be used for abnormal condition recognition in process industry complex system where continuous multi-channel data are monitored. The effectiveness of the approach is illustrated using data from a simulated dataset and a chemical plant model where potential abnormal conditions are detected effectively, thus avoid severe system safety problems.
  • Keywords
    condition monitoring; feature extraction; large-scale systems; safety; time series; uncertainty handling; Dempster-Shafer evidence theory; chemical plant model; condition recognition; multifractal analysis; multifractal detrended fluctuation analysis; multifractal spectrum; multisource information fusion; nonlinear feature extraction; process industry complex system; safety problems; time series data; Data models; Error analysis; Fault detection; Feature extraction; Fractals; Monitoring; Principal component analysis; Condition recognition; Dempster-Shafer evidence theory; Multifractal analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-8857-5
  • Type

    conf

  • DOI
    10.1109/RAMS.2011.5754454
  • Filename
    5754454