Title :
Numerical parasitic reactances at the interface between FDTD mesh and lumped elements
Author :
Borzetta, L. ; Alimenti, F. ; Ciampolini, P. ; Mezzanotte, P. ; Roselli, L. ; Sorrentino, R.
Author_Institution :
Dipt. di Ingegneria Elettronica e dell´Inf., Perugia Univ., Italy
Abstract :
This contribution focuses on the accuracy degradation arising at the interface between lumped element (LE) models and FDTD algorithm. The presence of numerical parasitic reactances has been already noticed in the past. Here these reactances have been estimated and numerical experiments have been given to prove the validity of the estimation provided.
Keywords :
circuit simulation; electric reactance; equivalent circuits; finite difference time-domain analysis; lumped parameter networks; parallel plate waveguides; waveguide theory; FDTD mesh; accuracy degradation; estimation; interface; lumped elements; numerical parasitic reactances; Analytical models; Circuits; Degradation; Electromagnetic analysis; Equations; Finite difference methods; Helium; Inductance; Parasitic capacitance; Time domain analysis;
Conference_Titel :
Microwave Symposium Digest, 1999 IEEE MTT-S International
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-5135-5
DOI :
10.1109/MWSYM.1999.780261
