Title :
Determining two-port S-parameters from a one-port measurement using a novel impedance-state test chip
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
A novel custom high-speed test chip and data reduction technique that allows for the accurate determination of the two-port S-parameters of a passive network from a set of one-port measurements is presented. A typical application for this technique is high-speed integrated circuit package characterization where one-port is of a microelectronic size scale and inside the package. The test chip is designed to operate up to 20 GHz.
Keywords :
S-parameters; data reduction; high-speed integrated circuits; integrated circuit packaging; microwave measurement; network analysers; passive networks; two-port networks; 20 GHz; S-parameters; data reduction; high-speed integrated circuit package; impedance-state test chip; one-port measurement; passive two-port network; Bonding; Impedance measurement; Measurement standards; Measurement techniques; Packaging; Radio frequency; Reflection; Scattering parameters; Switches; Testing;
Conference_Titel :
Microwave Symposium Digest, 1999 IEEE MTT-S International
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-5135-5
DOI :
10.1109/MWSYM.1999.780284
