Title :
Comparison of methods for adapter characterization
Author :
Randa, J. ; Wiatr, W. ; Billinger, R.L.
Author_Institution :
Radio-Frequency Technol. Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
We review and compare three methods for characterization of precision adapters using a vector network analyzer. Two of the methods are one-port techniques, and the third is an established two-port adapter-removal technique. The intrinsic efficiencies of three adapters are measured with each technique, and the results are compared. The results generally agree within 0.005, which is within the estimated uncertainties of the techniques.
Keywords :
S-matrix theory; microwave measurement; multiport networks; network analysers; waveguide couplers; adapter characterization; intrinsic efficiencies; one-port techniques; precision adapters; two-port adapter-removal technique; vector network analyzer; Coaxial components; Connectors; Documentation; Loss measurement; NIST; Phase measurement; Radio frequency; Reflection; Scattering; Transmission line matrix methods;
Conference_Titel :
Microwave Symposium Digest, 1999 IEEE MTT-S International
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-5135-5
DOI :
10.1109/MWSYM.1999.780340
