DocumentCode :
3006197
Title :
Sigma Set: A small second order statistical region descriptor
Author :
Xiaopeng Hong ; Hong Chang ; Shiguang Shan ; Xilin Chen ; Wen Gao
Author_Institution :
Sch. of Comput. Sci. & Technol., Harbin Inst. of Technol., Harbin, China
fYear :
2009
fDate :
20-25 June 2009
Firstpage :
1802
Lastpage :
1809
Abstract :
Given an image region of pixels, second order statistics can be used to construct a descriptor for object representation. One example is the covariance matrix descriptor, which shows high discriminative power and good robustness in many computer vision applications. However, operations for the covariance matrix on Riemannian manifolds are usually computationally demanding. This paper proposes a novel second order statistics based region descriptor, named “Sigma Set”, in the form of a small set of vectors, which can be uniquely constructed through Cholesky decomposition on the covariance matrix. Sigma Set is of low dimension, powerful and robust. Moreover, compared with the covariance matrix, Sigma Set is not only more efficient in distance evaluation and average calculation, but also easier to be enriched with first order statistics. Experimental results in texture classification and object tracking verify the effectiveness and efficiency of this novel object descriptor.
Keywords :
covariance matrices; higher order statistics; image classification; image representation; image resolution; image texture; matrix decomposition; Cholesky decomposition; Riemannian manifold; Sigma Set; average calculation; computer vision; covariance matrix descriptor; distance evaluation; first order statistics; image pixel region; object descriptor; object representation; object tracking; region descriptor; second order statistical region descriptor; texture classification; vector; Computer science; Fractals; Histograms; Lighting; Mathematics; Power engineering and energy; Power engineering computing; Robustness; Solids; Statistics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
Conference_Location :
Miami, FL
ISSN :
1063-6919
Print_ISBN :
978-1-4244-3992-8
Type :
conf
DOI :
10.1109/CVPR.2009.5206742
Filename :
5206742
Link To Document :
بازگشت