DocumentCode :
3006221
Title :
Hazardous Waste Concerns & Solutions in a Microelectronics Laboratory
Author :
Woodie, Daniel
Author_Institution :
Cornell NanoScale Facility, Cornell Univ., Ithaca, NY, USA
fYear :
2010
fDate :
June 28 2010-July 1 2010
Firstpage :
1
Lastpage :
3
Abstract :
Microelectronic labs create some common classes of hazardous waste from solutions such as piranha etch, RCA cleans, etc. Safely handling these solutions while complying with EPA hazardous waste regulations can be a challenge. This presentation will briefly cover some of the regulations dealing with these issues and how the Cornell NanoScale Facility (CNF) has worked to follow them. Over the years, various incidents have occurred that have lead to the CNF developing some unique solutions to a few of these problems commonly facing labs handling this type of waste. An overview of some of these incidents will be presented, along with the solutions developed to mitigate future risk.
Keywords :
hazardous materials; integrated circuits; waste handling; Cornell NanoScale Facility; EPA hazardous waste regulation; microelectronic laboratory; Biomembranes; Chemical hazards; Chemical processes; Containers; Gases; Laboratories; Microelectronics; Plastics; Testing; Waste handling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro/Nano Symposium (UGIM), 2010 18th Biennial University/Government/Industry
Conference_Location :
West Lafayette, IN
ISSN :
0749-6877
Print_ISBN :
978-1-4244-4731-2
Electronic_ISBN :
0749-6877
Type :
conf
DOI :
10.1109/UGIM.2010.5508852
Filename :
5508852
Link To Document :
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