DocumentCode :
3006355
Title :
Convexity and Bayesian constrained local models
Author :
Paquet, Ulrich
Author_Institution :
Imense Ltd., Cambridge, UK
fYear :
2009
fDate :
20-25 June 2009
Firstpage :
1193
Lastpage :
1199
Abstract :
The accurate localization of facial features plays a fundamental role in any face recognition pipeline. Constrained local models (CLM) provide an effective approach to localization by coupling ensembles of local patch detectors for non-rigid object alignment. A recent improvement has been made by using generic convex quadratic fitting (CQF), which elegantly addresses the CLM warp update by enforcing convexity of the patch response surfaces. In this paper, CQF is generalized to a Bayesian inference problem, in which it appears as a particular maximum likelihood solution. The Bayesian viewpoint holds many advantages: for example, the task of feature localization can explicitly build on previous face detection stages, and multiple sets of patch responses can be seamlessly incorporated. A second contribution of the paper is an analytic solution to finding convex approximations to patch response surfaces, which removes CQF´s reliance on a numeric optimizer. Improvements in feature localization performance are illustrated on the Labeled Faces in the Wild and BioID data sets.
Keywords :
Bayes methods; approximation theory; face recognition; feature extraction; maximum likelihood estimation; object detection; Bayesian constrained local model; Bayesian inference problem; CLM warp update; convex approximation; face detection; face recognition pipeline; facial features; feature localization performance; generic convex quadratic fitting; local patch detector; maximum likelihood solution; nonrigid object alignment; patch response surfaces; Bayesian methods; Detectors; Face detection; Face recognition; Facial features; Maximum likelihood detection; Object detection; Pipelines; Response surface methodology; Surface fitting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
Conference_Location :
Miami, FL
ISSN :
1063-6919
Print_ISBN :
978-1-4244-3992-8
Type :
conf
DOI :
10.1109/CVPR.2009.5206751
Filename :
5206751
Link To Document :
بازگشت