• DocumentCode
    3006580
  • Title

    Bright-field Analysis Of Field-emission Cones Using High-resolution Transmission Electron Microscopy

  • Author

    Goodhue, W.D. ; Nitishin, P.M. ; Harris, C.T. ; Bozler, C.O. ; Rathman, D.D. ; Johnson, G.D. ; Hollis, M.A.

  • Author_Institution
    Massachusetts Institute of Technology
  • fYear
    1993
  • fDate
    12-15 Jul 1993
  • Firstpage
    112
  • Lastpage
    113
  • Keywords
    Cathodes; Electron emission; High-resolution imaging; Image resolution; Laboratories; Microelectronics; Performance analysis; Shape; Transmission electron microscopy; Vacuum technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Microelectronics Conference, 1993., Proceedings of IEEE 6th International
  • Print_ISBN
    0-7803-0852-2
  • Type

    conf

  • DOI
    10.1109/IVMC.1993.700305
  • Filename
    700305
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3006580