Title :
Identification in the presence of bounded low-correlated noise
Author :
Venkatesh, S.R. ; Chen, I-Chieh ; Dahleh, Munther A. ; Tsitsiklis, John N.
Author_Institution :
MIT, Cambridge, MA
Abstract :
In this paper, we consider the problem of identification of discrete-time, single-input single-output linear time-invariant systems. The prior information about the unknown plant is that it belongs to a certain set of LTI systems. The plant can be identified using input-output experiments, where the input can be chosen freely and the observed output is corrupted by an additive disturbance which is assumed to be bounded and has low-correlation. This set of disturbance includes uniformly bounded sequences that satisfy a time averages correlation condition. The motivation for using such a disturbance set is that the disturbances resemble stochastic white noise processes. In particular, a white noise signal belongs to this set with high probability if the bound on the correlations approaches zero at a certain rate. This paper analyzes the problem of worst-case identification in the presence of the above set of disturbances
Keywords :
correlation methods; discrete time systems; identification; linear systems; white noise; SISO systems; additive disturbance; bounded low-correlated noise; correlation; discrete-time systems; linear time-invariant systems; white noise; worst-case identification; Finite impulse response filter; Laboratories; Length measurement; Linear systems; Noise measurement; Polynomials; Stochastic processes; Stochastic resonance; Upper bound; White noise;
Conference_Titel :
American Control Conference, Proceedings of the 1995
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-2445-5
DOI :
10.1109/ACC.1995.532080