• DocumentCode
    3010108
  • Title

    Cell-plate-line and bit-line complementarily sensed (CBCS) architecture for ultra low-power non-destructive DRAMs

  • Author

    Hamamoto, T. ; Morooka, Y. ; Asakura, M. ; Ozaki, H.

  • Author_Institution
    ULSI Lab., Mitsubishi Electr. Corp., Itami, Japan
  • fYear
    1995
  • fDate
    8-10 June 1995
  • Firstpage
    79
  • Lastpage
    80
  • Abstract
    In order to develop very high density DRAMs, the reduction of memory-array current, accounting for over 80% of total chip current, must be given serious consideration. As the number of activated sense-amplifiers (SAs) increase, the amount of consumed charge on bit-lines (BLs) increases accordingly. This paper describes a novel circuit design, called Cell-Plate-Line and Bit-Line Complementarily Sensed (CBCS) Architecture. Only the selected SA of a whole array is activated, thereby reducing array read/write current to below 1% compared with conventional ones. Furthermore, refresh operation can easily be executed and the array refresh current is reduced to below 50% without loss of the read-out differential signal.
  • Keywords
    DRAM chips; memory architecture; nondestructive readout; CBCS architecture; bit-line; cell-plate-line; circuit design; complementary sensing; memory-array current; read-out differential signal; refresh current; sense-amplifiers; ultra low-power nondestructive DRAMs; Capacitors; Circuit synthesis; Electrodes; Gold; Laboratories; Page description languages; Random access memory; Signal restoration; Synthetic aperture sonar; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 1995. Digest of Technical Papers., 1995 Symposium on
  • Conference_Location
    Kyoto, Japan
  • Print_ISBN
    0-7800-2599-0
  • Type

    conf

  • DOI
    10.1109/VLSIC.1995.520694
  • Filename
    520694