DocumentCode
3010108
Title
Cell-plate-line and bit-line complementarily sensed (CBCS) architecture for ultra low-power non-destructive DRAMs
Author
Hamamoto, T. ; Morooka, Y. ; Asakura, M. ; Ozaki, H.
Author_Institution
ULSI Lab., Mitsubishi Electr. Corp., Itami, Japan
fYear
1995
fDate
8-10 June 1995
Firstpage
79
Lastpage
80
Abstract
In order to develop very high density DRAMs, the reduction of memory-array current, accounting for over 80% of total chip current, must be given serious consideration. As the number of activated sense-amplifiers (SAs) increase, the amount of consumed charge on bit-lines (BLs) increases accordingly. This paper describes a novel circuit design, called Cell-Plate-Line and Bit-Line Complementarily Sensed (CBCS) Architecture. Only the selected SA of a whole array is activated, thereby reducing array read/write current to below 1% compared with conventional ones. Furthermore, refresh operation can easily be executed and the array refresh current is reduced to below 50% without loss of the read-out differential signal.
Keywords
DRAM chips; memory architecture; nondestructive readout; CBCS architecture; bit-line; cell-plate-line; circuit design; complementary sensing; memory-array current; read-out differential signal; refresh current; sense-amplifiers; ultra low-power nondestructive DRAMs; Capacitors; Circuit synthesis; Electrodes; Gold; Laboratories; Page description languages; Random access memory; Signal restoration; Synthetic aperture sonar; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits, 1995. Digest of Technical Papers., 1995 Symposium on
Conference_Location
Kyoto, Japan
Print_ISBN
0-7800-2599-0
Type
conf
DOI
10.1109/VLSIC.1995.520694
Filename
520694
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