Title :
Built-in test IC provides automatic test equipment capabilities
Author_Institution :
ATE Solutions, Inc., Westlake Village, CA, USA
Abstract :
An approach to implementing built-in test (BIT) and built-in test equipment (BITE) is introduced. It consists of an IC that was designed to be used with any digital circuit. Called built-in test exerciser and sensor or BITES, the chip furnishes all stimuli generation and response measurements needed to monitor performance. It also detects and isolates faults in digital systems, circuit boards, and ASICs. BITES can facilitate a variety of tests with a general-purpose computer that would otherwise require several generically different automatic test equipments (ATEs). Combined with boundary-scan, it can also provide test features not available with conventional ATE
Keywords :
application specific integrated circuits; automatic test equipment; built-in self test; digital integrated circuits; fault location; integrated circuit testing; logic testing; microprocessor chips; printed circuit testing; ASICs; ATE; BIT; BITE; BITES; PCB testing; automatic test equipment; boundary-scan; built-in test exerciser and sensor; digital circuit; functional tester; in-circuit tester; performance monitoring; response measurements; stimuli generation; Automatic test equipment; Built-in self-test; Circuit faults; Circuit testing; Computerized monitoring; Digital circuits; Digital integrated circuits; Electrical fault detection; Fault detection; Semiconductor device measurement;
Conference_Titel :
AUTOTESTCON '91. IEEE Systems Readiness Technology Conference. Improving Systems Effectiveness in the Changing Environment of the '90s, Conference Record.
Conference_Location :
Anaheim, CA
Print_ISBN :
0-87942-576-8
DOI :
10.1109/AUTEST.1991.197565
