DocumentCode
301205
Title
Optimization of sensor response functions for colorimetry of reflective and emissive objects
Author
Wolski, Mark ; Bouman, Charles A. ; Allebach, Jan P. ; Walowit, Eric
Author_Institution
Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
Volume
2
fYear
1995
fDate
23-26 Oct 1995
Firstpage
323
Abstract
This paper describes the design of color filters for a surface color measurement device. The function of the device is to return the XYZ tristimulus vector characterizing the color of the surface. The device is designed to measure emissive as well as reflective surfaces. It uses an internal set of LEDs to illuminate reflective surfaces while characterizing their color under assumed standard illuminants. In the design of the filters, we formulate a nonlinear optimization problem with the goal of minimizing error in the uniform color space CIE L*a*b*. Our optimization criteria employs a technique to retain a linear structure while approximating the true L*a*b* error. In addition, our solution is regularized to account for system noise, filter roughness and filter implementation errors. Experimental results indicate average and worst case device accuracy of 0.27 L*a*b* ΔE units and 1.56 L*a*b* ΔE units for a “system tolerance” of 0.0005
Keywords
colorimetry; error analysis; minimisation; optical filters; optical variables measurement; XYZ tristimulus vector; color filters; colorimetry; design; emissive objects; emissive surfaces; error minimization; filter implementation errors; filter roughness; linear structure; nonlinear optimization problem; reflective objects; reflective surfaces; sensor response functions; surface color measurement device; system noise; system tolerance; Band pass filters; Colored noise; Design engineering; Electric variables measurement; Energy measurement; Light emitting diodes; Lighting; Linear approximation; Matched filters; Nonlinear filters;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing, 1995. Proceedings., International Conference on
Conference_Location
Washington, DC
Print_ISBN
0-8186-7310-9
Type
conf
DOI
10.1109/ICIP.1995.537480
Filename
537480
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