Modeling dynamics of memristive nano-structures

This work presents a novel, simple, accurate and general model capturing the nonlinear dynamics of memristive nano-scale structures including the thin double-layer oxide film manufactured at Hewlett-Packard Labs in 2008. Advantages over other models include ease of analytical integration, existence of closed-form solutions under any input/initial condition combination and opportunity to tune boundary conditions so as to detect either single-valued or multi-valued state-flux characteristics under sign-varying input.