DocumentCode
3014753
Title
Detection of faulty products using data mining
Author
Karim, M.A. ; Russ, G. ; Islam, Aminul
Author_Institution
Sch. of Eng. Syst., Queensland Univ. of Technol., QLD
fYear
2008
fDate
24-27 Dec. 2008
Firstpage
101
Lastpage
107
Abstract
The manufacturing process is complex due to the large number of processes, diverse equipment set and nonlinear process flows. Manufacturers constantly face yield and quality problems as they constantly redesign their processes for the rapid introduction of new products and adoption of new process technologies. Solving product yield and quality problems in a manufacturing process is becoming increasingly difficult. There are various types of failures and their causes have complex multi-factor interrelationships. High innovation speed forced today´s manufacturers to find failure causes quickly by examining the historical manufacturing data. Data mining offers tools for quick discovery of relationships, patterns, and knowledge in large databases. This has been applied to many fields such as biological technology, financial analysis, medical information, etc. Application of data mining to manufacturing is relatively limited mainly because of complexity of manufacturing data. Growing self-organizing map (GSOM) algorithm has been proven to be an efficient algorithm to analyze unsupervised DNA data. However, it produced unsatisfactory clustering when used on some manufacturing data. Moreover, there was no benchmark to monitor improvement in clustering. In this study a method has been proposed to evaluate quality of the clusters produced by GSOM and to remove insignificant variables from the dataset. With the proposed modifications, significant improvement in unsupervised clustering was achieved with complex manufacturing data. Results show that the proposed method is able to effectively differentiate good and faulty products.
Keywords
data mining; fault diagnosis; flaw detection; manufactured products; manufacturing data processing; manufacturing processes; pattern clustering; product development; quality control; self-organising feature maps; very large databases; faulty product detection; growing self-organizing map algorithm; large database; manufacturing data mining; manufacturing process; product quality; product yield; unsupervised clustering; Algorithm design and analysis; Clustering algorithms; Data analysis; Data mining; Databases; Face detection; Fault detection; Information analysis; Manufacturing processes; Technological innovation;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer and Information Technology, 2008. ICCIT 2008. 11th International Conference on
Conference_Location
Khulna
Print_ISBN
978-1-4244-2135-0
Electronic_ISBN
978-1-4244-2136-7
Type
conf
DOI
10.1109/ICCITECHN.2008.4803116
Filename
4803116
Link To Document