Title :
Integrated flash memory and logic testing-a high volume, low cost approach
Author :
Yuin, Lee Chan ; Kong, Janaka Low Chee ; Chien, Choo Wei
Author_Institution :
Intel Technol. Sdn. Bhd., Penang, Malaysia
Abstract :
The semiconductor industry´s trend to offer more value-added products that integrate flash memory with logic devices poses a significant challenge to manufacturing test operations. This paper details those challenges and how they were systematically overcome on a lead product at Intel Penang. The end result is a manufacturing process whose productivity, cost and HVM (high volume manufacturing) indicators are equivalent to those of stand-alone logic devices. These techniques can be proliferated to other types of integrated devices
Keywords :
flash memories; integrated circuit testing; integrated logic circuits; integrated memory circuits; production testing; flash memory; high volume manufacturing indicators; integrated devices; integrated flash memory/logic device testing; logic devices; manufacturing process; manufacturing process cost; manufacturing process productivity; manufacturing test; semiconductor industry; stand-alone logic devices; test cost; test volume; value-added products; Costs; EPROM; Flash memory; Logic devices; Logic programming; Logic testing; Manufacturing; Production facilities; Sequential analysis; System testing;
Conference_Titel :
Semiconductor Electronics, 1998. Proceedings. ICSE '98. 1998 IEEE International Conference on
Conference_Location :
Bangi
Print_ISBN :
0-7803-4971-7
DOI :
10.1109/SMELEC.1998.781152
