Memory fault diagnosis by syndrome compression

Author

Li, Jin-Fu ; Wu, Cheng-Wen

Author_Institution

Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan

fYear

2001

fDate

2001

Firstpage

97

Lastpage

101

Abstract

In this paper we present a data compression technique that can be used to speed up the transmission of diagnosis data from the embedded RAM with built-in self-diagnosis (BISD) support. The proposed approach compresses the faulty-cell address and March syndrome to about 28% of the original size under the March-17N diagnostic test algorithm. The key component of the compressor is a novel syndrome-accumulation circuit, which can be realized by a content-addressable memory. Experimental results show that the area overhead is about 0.9% for a 1Mb SRAM with 164 faults. The proposed compression technique reduces the time for diagnostic test, as well as the tester storage capacity requirement

Keywords

SRAM chips; built-in self test; content-addressable storage; data compression; fault diagnosis; integrated circuit testing; logic testing; 1 Mbit; March syndrome; March-17N diagnostic test algorithm; SRAM; area overhead; built-in self-diagnosis; content-addressable memory; data compression technique; diagnosis data; embedded RAM; faulty-cell address; memory fault diagnosis; syndrome compression; syndrome-accumulation circuit; tester storage capacity; Circuit faults; Circuit testing; Data compression; Decoding; Displays; Fault diagnosis; Laboratories; Random access memory; Read-write memory; Software testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings

Conference_Location

Munich

ISSN

1530-1591

Print_ISBN

0-7695-0993-2

Type

conf

DOI

10.1109/DATE.2001.915007

Filename

915007