DocumentCode :
3016547
Title :
A static power estimation methodology for IP-based design
Author :
Liu, Xun ; Papaefthymiou, Marios C.
Author_Institution :
Dept. of Electr. Eng., Michigan Univ., Ann Arbor, MI, USA
fYear :
2001
fDate :
2001
Firstpage :
280
Lastpage :
287
Abstract :
This paper proposes a novel system-level power estimation methodology for electronic designs consisting of intellectual property (IP) components. Our methodology relies on analytical output and power macromodels of the IP blocks to estimate system dissipation without performing any simulation. We derive upper bounds on the estimation error of our methodology and demonstrate the relation of this error to the sensitivities of the macromodeling functions. For circuits without feedback, we give a sufficient condition for the worst-case power estimation error to increase only linearly with the length of the IP cascades. We also give a tighter sufficient condition that ensures error boundedness in IP systems of any topology. Experiments with signal processing and data encryption systems validate the accuracy and efficiency of our approach. For designs of up to 576 IP blocks, power estimates are obtained within 0.2 seconds. In comparison with switch-level simulation results, the average error of our power estimates is 7.3%
Keywords :
circuit analysis computing; digital signal processing chips; low-power electronics; parameter estimation; sequential circuits; IP blocks; IP components; IP-based design; analytical output macromodels; analytical power macromodels; data encryption systems; electronic designs; error boundedness; estimation error; intellectual property components; macromodeling functions; signal processing systems; static power estimation methodology; system dissipation; system-level power estimation methodology; upper bounds; Analytical models; Circuit simulation; Circuit topology; Design methodology; Estimation error; Feedback circuits; Intellectual property; Performance analysis; Sufficient conditions; Upper bound;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
Conference_Location :
Munich
ISSN :
1530-1591
Print_ISBN :
0-7695-0993-2
Type :
conf
DOI :
10.1109/DATE.2001.915038
Filename :
915038
Link To Document :
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