DocumentCode
3017301
Title
Multiple Class Segmentation Using A Unified Framework over Mean-Shift Patches
Author
Yang, Lin ; Meer, Peter ; Foran, David J.
Author_Institution
Rutgers Univ., Piscataway
fYear
2007
fDate
17-22 June 2007
Firstpage
1
Lastpage
8
Abstract
Object-based segmentation is a challenging topic. Most of the previous algorithms focused on segmenting a single or a small set of objects. In this paper, the multiple class object-based segmentation is achieved using the appearance and bag of keypoints models integrated over mean-shift patches. We also propose a novel affine invariant descriptor to model the spatial relationship of keypoints and apply the elliptical Fourier descriptor to describe the global shapes. The algorithm is computationally efficient and has been tested for three real datasets using less training samples. Our algorithm provides better results than other studies reported in the literature.
Keywords
Fourier analysis; image segmentation; object detection; elliptical Fourier descriptor; mean-shift patches; multiple class segmentation; object-based segmentation; Bayesian methods; Biomedical imaging; Biomedical informatics; Cancer; Clustering algorithms; Histograms; Image segmentation; Object recognition; Shape; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition, 2007. CVPR '07. IEEE Conference on
Conference_Location
Minneapolis, MN
ISSN
1063-6919
Print_ISBN
1-4244-1179-3
Electronic_ISBN
1063-6919
Type
conf
DOI
10.1109/CVPR.2007.383229
Filename
4270254
Link To Document