• DocumentCode
    3021397
  • Title

    Surface defect detection and classification in mandarin fruits using fuzzy image thresholding, binary wavelet transform and linear classifier model

  • Author

    Kamalakannan, A. ; Rajamanickam, G.

  • Author_Institution
    Central Electron. Eng. Res. Inst., Chennai Centre, Chennai, India
  • fYear
    2012
  • fDate
    13-15 Dec. 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Machine vision systems with effective image processing methods are used in quality grading of agricultural products. A pattern recognition technique was developed to detect and classify surface defects such as pitting, splitting and stem-end rot found in images of mandarin fruits. The developed technique employs fuzzy thresholding for image segmentation, binary wavelet transform (BWT) for feature extraction and a rule based linear classifier model for detection and classification of the defects. The moment invariants computed from the detail subimage of BWT were taken as feature values. This paper in detail describes about the pattern recognition algorithm and its implementation. The detection and classification results obtained from the algorithm are reported and discussed.
  • Keywords
    agricultural products; fuzzy set theory; image classification; image segmentation; wavelet transforms; BWT; agricultural products; binary wavelet transform; feature extraction; fuzzy image thresholding; image processing methods; image segmentation; linear classifier model; machine vision systems; mandarin fruits; pattern recognition technique; surface defect classification; surface defect detection; Classification algorithms; Computational modeling; Feature extraction; Image segmentation; Pattern recognition; Surface treatment; Training; BWT; Mandarin fruit; image thresholding; moment invariants; pattern recognition & linear classifier; surface defects; type-2 fuzzy sets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Computing (ICoAC), 2012 Fourth International Conference on
  • Conference_Location
    Chennai
  • Print_ISBN
    978-1-4673-5583-4
  • Type

    conf

  • DOI
    10.1109/ICoAC.2012.6416829
  • Filename
    6416829