Title :
Compendium of Test Results of Single Event Effects Conducted by the Jet Propulsion Laboratory
Author :
Allen, Gregory R.
Author_Institution :
Jet Propulsion Lab. (JPL), Pasadena, CA
Abstract :
This paper reports heavy ion and proton induced single event effects results for a variety of microelectronic devices targeted for possible use in NASA spacecrafts. The compendium covers a sampling of devices tested over the past eight years.
Keywords :
integrated circuit testing; ion beam effects; proton effects; radiation hardening (electronics); space vehicle electronics; Jet Propulsion Laboratory; NASA spacecraft; device testing; heavy ion effect; microelectronic devices; proton induced effect; single event effects; Cyclotrons; Laboratories; Microelectronics; NASA; Neutrons; Performance evaluation; Propulsion; Protons; Space vehicles; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2008 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4244-2545-7
DOI :
10.1109/REDW.2008.11
