• DocumentCode
    3021970
  • Title

    Single Event Effects and Total Dose Test Results for TI TLK2711 Transceiver

  • Author

    Koga, R. ; Yu, P. ; George, J.

  • Author_Institution
    Aerosp. Corp., El Segundo, CA
  • fYear
    2008
  • fDate
    14-18 July 2008
  • Firstpage
    69
  • Lastpage
    75
  • Abstract
    TLK2711 transceivers belonging to the Class V dice manufactured by Texas Instruments were tested for their sensitivity to radiation. We measured single event effects as well as total ionizing dose effects.
  • Keywords
    integrated circuit testing; radiation hardening (electronics); transceivers; TI TLK2711 transceiver; Texas Instruments Class V dice; radiation sensitivity; single event effects; total ionizing dose effects; Bit error rate; Clocks; Decoding; Encoding; Manufacturing; Phase locked loops; Protons; Single event upset; Testing; Transceivers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2008 IEEE
  • Conference_Location
    Tucson, AZ
  • Print_ISBN
    978-1-4244-2545-7
  • Type

    conf

  • DOI
    10.1109/REDW.2008.19
  • Filename
    4638617
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3021970