• DocumentCode
    3023710
  • Title

    Fast and accurate estimation of gain and sample-time mismatches in time-interleaved ADCs using on-chip oscillators

  • Author

    Santin, E. ; Oliveira, L.B. ; Goes, J.

  • Author_Institution
    Dept. de Eng. Electrotec., Univ. Nova de Lisboa (UNL), Caparica, Portugal
  • fYear
    2012
  • fDate
    20-23 May 2012
  • Firstpage
    3154
  • Lastpage
    3157
  • Abstract
    The estimation of inter-channel mismatches in time-interleaved analog-to-digital converters (TI-ADCs) is a crucial step towards the compensation of output errors inherent of these converters. In this paper, we investigate a fast, accurate and low-complexity method for estimation of static gain and sample-time mismatches. The proposed technique uses a calibration signal generated on-chip through a sinusoidal oscillator inserted into a phase-locked loop (PLL), similarly as the sampling clock signal is usually generated in these high speed conversion systems. We synchronize these two PLLs to allow efficient frequency domain computations, without resorting to windowing, from which accurate estimations are feasible. We show that the accuracy of the method is not affected by nonidealities in the calibration signal as long as the calibration frequency is carefully selected.
  • Keywords
    analogue-digital conversion; calibration; clocks; frequency-domain analysis; oscillators; phase locked loops; calibration frequency; calibration signal; conversion system; frequency domain computation; inter-channel mismatch estimation; on-chip oscillator; output error compensation; phase-locked loop; sample-time mismatch estimation; sampling clock signal; sinusoidal oscillator; static gain estimation; time-interleaved ADC; time-interleaved analog-to-digital converter; Accuracy; Analog-digital conversion; Calibration; Discrete Fourier transforms; Estimation; Harmonic analysis; Phase locked loops;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
  • Conference_Location
    Seoul
  • ISSN
    0271-4302
  • Print_ISBN
    978-1-4673-0218-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.2012.6271991
  • Filename
    6271991