DocumentCode
3027829
Title
Special probe waveforms for flaw detection at “hot spots”
Author
Greve, D.W. ; Oppenheim, I.J.
Author_Institution
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA
fYear
2008
fDate
2-5 Nov. 2008
Firstpage
180
Lastpage
183
Abstract
In this paper we examine the creation of a special probe waveform that, when applied to an emitting transducer at location A, results in a strong received signal at that transducer at a particular later time only when a scattering center is present at location B. The probing waveform can be calculated directly from the Green´s function for propagation from A to B. Such a probe waveform can be used to detect scattering centers at the ldquohot spotrdquo location B.
Keywords
flaw detection; ultrasonic materials testing; Green´s function; emitting transducer; flaw detection; hot spots; scattering center; special probe waveforms; Acoustic emission; Acoustic pulses; Acoustic scattering; Frequency; Green´s function methods; Inspection; Object detection; Probes; Reflection; Transducers; inspection; probe waveform; time reversal;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2008. IUS 2008. IEEE
Conference_Location
Beijing
Print_ISBN
978-1-4244-2428-3
Electronic_ISBN
978-1-4244-2480-1
Type
conf
DOI
10.1109/ULTSYM.2008.0044
Filename
4803676
Link To Document