DocumentCode
3027868
Title
Extended Combination Testing: Generates Array Test Suite
Author
Xie, Xiaodong ; Lu, Yansheng
Author_Institution
Sch. of Comput. Sci. & Technol., Huazhong Univ. of Sci. & Technol., Wuhan, China
fYear
2009
fDate
10-12 Aug. 2009
Firstpage
685
Lastpage
690
Abstract
Traditional testing methods tend to generate test suite for programs of which parameters are basic data types, e.g. integer, real or Boolean. However, there are lots of programs with inputs of complex data types, e.g. array, point or structure, traditional testing methods canpsilat deal with them. This paper focuses on testing programs with array parameter that is widely used in programming. The difficulties to generate array test suite lie in two reasons. The first reason is that array is composed by several ordered, interactional elements. Thus, we cannot take the array as several independent, isolated elements when generating array test suite. The second one is that we should consider the implicative attributes of array effecting the generation of test suite, e.g. the size of array, or some special elements in array. This paper proposes a new testing method, extended combination testing (ECT), to generate array test suite systemically. Through based on traditional combination testing, ECT extends its application scope form basic data test suite generation to array test suite generation. ECT proceeds in three steps: (1) yield values of other non-array parameters and spawn them to a proper combination; (2) identify the implicative attributes of array; (3) choose values for each array elements, and combine values of array elements with proper combination coverage into test suite. While in traditional combination test, only step (3) is included. The results of our experiment validate the effectiveness of ECT in generating array test suite.
Keywords
program testing; array parameter; array test suite generation; extended combination testing; traditional testing methods; Application software; Computer science; Distributed processing; Electrical capacitance tomography; Logic testing; Out of order; Software testing; Sorting; System testing; array parameter; combination testing; test suite generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Parallel and Distributed Processing with Applications, 2009 IEEE International Symposium on
Conference_Location
Chengdu
Print_ISBN
978-0-7695-3747-4
Type
conf
DOI
10.1109/ISPA.2009.55
Filename
5207860
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