Title :
The dedicated observer approach to instrument failure detection
Author_Institution :
University of Washington, Seattle, Washington
Abstract :
One approach to the problem of detecting instrument failure in operating systems using functional redundancy (as opposed to hardware redundancy) is described. The practical feasibility of this scheme is discussed in terms of results obtained on simulators. A bibliography covering the field of fault detection by "artificial" redundancy is included.
Keywords :
Bibliographies; Computational modeling; Data processing; Ferroelectric films; Hardware; Instruments; Nonvolatile memory; Operating systems; Random access memory; Redundancy;
Conference_Titel :
Decision and Control including the Symposium on Adaptive Processes, 1979 18th IEEE Conference on
Conference_Location :
Fort Lauderdale, FL, USA
DOI :
10.1109/CDC.1979.270170