DocumentCode
302897
Title
X-ray crystal density study on a FZ silicon crystal for the determination of the Avogadro constant
Author
Tanaka, Mitsuru ; Fujii, Kenichi ; Nezu, Y. ; Nakayama, Keisuke ; Fujimoto, Hiroshi ; Gonnda, S. ; De Bievre, P. ; Valkiers, S. ; Toy, Y.
Author_Institution
Nat. Res. Lab. of Metrol., Ibaraki, Japan
fYear
1996
fDate
17-21 June 1996
Firstpage
169
Lastpage
170
Abstract
The systematic errors for the determination of the Avogadro constant using a FZ silicon ingot for NRLM are analyzed by studying the silica layer on the surface, macroscopic and microscopic defect in the body, of the sphere and concluded Avogadro constant shows the discrepancies around 3ppm to previously reported numbers.
Keywords
X-ray diffraction; constants; density measurement; silicon; Avogadro constant; FZ silicon crystal; Si; X-ray crystal density; defects; sphere; surface silica layer; systematic error; Building materials; Chemical analysis; Chemical elements; Density measurement; Error correction; Laboratories; Lattices; Silicon compounds; X-ray detection; X-ray detectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location
Braunschweig, Germany
Print_ISBN
0-7803-3376-4
Type
conf
DOI
10.1109/CPEM.1996.546755
Filename
546755
Link To Document