• DocumentCode
    3030338
  • Title

    Cost effective soft error mitigation for parallel adders by exploiting inherent redundancy

  • Author

    Sun, Yan ; Zhang, Minxuan ; Li, Shaoqing ; Zhao, Yali

  • Author_Institution
    Sch. of Comput., Nat. Univ. of Defense Technol., Changsha, China
  • fYear
    2010
  • fDate
    2-4 June 2010
  • Firstpage
    224
  • Lastpage
    227
  • Abstract
    Soft errors in combinational logic have been considered as an important challenge for VLSI circuit design. As a kind of representative element of combinational logic, adders are widely used in arithmetic units. This paper presents a cost effective soft error mitigation technique for high speed parallel adders. By exploiting inherent hardware redundancy and temporal redundancy of circuit, this technique greatly reduces area overhead and delay overhead of fault tolerance. We also combine C-element-based error correction techniques with inherent hardware and temporal redundancy to enhance error correction capability of adders. In addition, we propose a new metric ADP to evaluate global overheads of soft error mitigation. Experiments show that the proposed technique can correct 93.76% of soft errors only with 12.23% of area and 6.41% of delay overhead. The proposed adder has the least ADP and best tradeoff between area and delay overhead of all previous designs.
  • Keywords
    VLSI; adders; combinational circuits; fault tolerance; logic design; C-element-based error correction; VLSI circuit design; combinational logic; cost effective soft error mitigation; fault tolerance; inherent redundancy; parallel adders; Adders; Circuit synthesis; Combinational circuits; Costs; Delay; Error correction; Hardware; Logic design; Redundancy; Very large scale integration; inherent redundancy; overhead; parallel adder; reliability; soft error;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IC Design and Technology (ICICDT), 2010 IEEE International Conference on
  • Conference_Location
    Grenoble
  • Print_ISBN
    978-1-4244-5773-1
  • Type

    conf

  • DOI
    10.1109/ICICDT.2010.5510255
  • Filename
    5510255