DocumentCode
3030338
Title
Cost effective soft error mitigation for parallel adders by exploiting inherent redundancy
Author
Sun, Yan ; Zhang, Minxuan ; Li, Shaoqing ; Zhao, Yali
Author_Institution
Sch. of Comput., Nat. Univ. of Defense Technol., Changsha, China
fYear
2010
fDate
2-4 June 2010
Firstpage
224
Lastpage
227
Abstract
Soft errors in combinational logic have been considered as an important challenge for VLSI circuit design. As a kind of representative element of combinational logic, adders are widely used in arithmetic units. This paper presents a cost effective soft error mitigation technique for high speed parallel adders. By exploiting inherent hardware redundancy and temporal redundancy of circuit, this technique greatly reduces area overhead and delay overhead of fault tolerance. We also combine C-element-based error correction techniques with inherent hardware and temporal redundancy to enhance error correction capability of adders. In addition, we propose a new metric ADP to evaluate global overheads of soft error mitigation. Experiments show that the proposed technique can correct 93.76% of soft errors only with 12.23% of area and 6.41% of delay overhead. The proposed adder has the least ADP and best tradeoff between area and delay overhead of all previous designs.
Keywords
VLSI; adders; combinational circuits; fault tolerance; logic design; C-element-based error correction; VLSI circuit design; combinational logic; cost effective soft error mitigation; fault tolerance; inherent redundancy; parallel adders; Adders; Circuit synthesis; Combinational circuits; Costs; Delay; Error correction; Hardware; Logic design; Redundancy; Very large scale integration; inherent redundancy; overhead; parallel adder; reliability; soft error;
fLanguage
English
Publisher
ieee
Conference_Titel
IC Design and Technology (ICICDT), 2010 IEEE International Conference on
Conference_Location
Grenoble
Print_ISBN
978-1-4244-5773-1
Type
conf
DOI
10.1109/ICICDT.2010.5510255
Filename
5510255
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