Title :
Electron Distribution in Non-uniformly Doped NPN Transistors
Author :
Syed, Nitu ; Bari, Rummana ; Rubaiyat, Tanjib ; Akter, Shahana ; Asif-Ul-Hoque, M.
Author_Institution :
Dept. of Electr. & Electron. Eng., Bangladesh Univ. of Eng. & Technol., Dhaka, Bangladesh
Abstract :
In this paper the analytical expressions of minority carrier distribution for Exponential and Gaussian doped base within the n-p-n bipolar transistors are obtained. The derivation of model equations starts by first considering low level of minority carrier injection within the base. A minority carrier profile is obtained by solving electric field equation and current equations for holes and electrons at equilibrium. Next a first order differential equation is obtained for minority carrier distribution. The solution of the differential equation gives the minority carrier profile. In this paper characteristics of the derived equations of minority carrier distribution are studied with the variation of different parameters with reliability. The analytical model is justified by using a simple TCAD simulation.
Keywords :
CAD; bipolar transistors; differential equations; reliability; Gaussian doped base; TCAD simulation; current equation; differential equation; electric field equation; electron distribution; minority carrier distribution; minority carrier injection; minority carrier profile; non-uniformly doped NPN transistor; npn bipolar transistor; reliability; Bipolar transistors; Current density; Doping; Equations; Impurities; Junctions; Mathematical model; Bipolar transistor; Exponential profile; Gaussian profile; Minority carrier; TCAD simulation;
Conference_Titel :
Computer Modeling and Simulation (EMS), 2011 Fifth UKSim European Symposium on
Conference_Location :
Madrid
Print_ISBN :
978-1-4673-0060-5
DOI :
10.1109/EMS.2011.73