DocumentCode
30318
Title
A Comparative Study of State-of-the-Art High-Performance Spectral Test Methods
Author
Sudani, Siva Kumar ; Li Xu ; Degang Chen
Volume
32
Issue
1
fYear
2015
fDate
Feb. 2015
Firstpage
26
Lastpage
35
Abstract
This paper observes that a number of new methods have emerged for efficient and effective testing of data converters, but there is no work comparing their strengths and weaknesses. The authors describes recent methods in detail, highlighting important aspects and contrasting their abilities to perform various test measurements.
Keywords
analogue-digital conversion; integrated circuit testing; measurement systems; data converters; high-performance spectral test; state-of-the-art spectral test; test measurements; Data conversion; Discrete Fourier transforms; Frequency estimation; Harmonic analysis; Mixed analog digital integrated circuits; Noise measurement; Performance evaluation; Power system harmonics; Spectral analysis; System-on-chip;
fLanguage
English
Journal_Title
Design & Test, IEEE
Publisher
ieee
ISSN
2168-2356
Type
jour
DOI
10.1109/MDAT.2014.2348315
Filename
6879281
Link To Document