A functional diagnostics methodology

Author

Kunda, Ramachandra P. ; Rathi, Bharat Deep

Author_Institution

Sun Microsyst., Mountain View, GA, USA

fYear

1990

fDate

17-19 Sep 1990

Firstpage

243

Lastpage

246

Abstract

The functional diagnostic methodology (FDM) used to develop the diagnostics for the research parallel processor prototype (RP3) is described. The FDM approach uses the instruction set to diagnose the computer system. In order to optimize the size of the diagnostic procedures, the subsystem is partitioned into modules, and the modules are further divided into a set of submodules or primitive logic components. The diagnostic procedures to test these basic submodules procedures to test these basic submodules and primitive logic components are then developed. The fault model that describes the failure modes considered in the FDM is presented. The FDM is illustrated using the ROMP processor as an example

Keywords

fault location; logic testing; ROMP processor; RP3; failure modes; fault model; functional diagnostics methodology; instruction set; logic components; modules; research parallel processor prototype; Automatic testing; Circuit faults; Circuit testing; Fault detection; Logic arrays; Logic gates; Logic testing; Prototypes; Sun; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Design: VLSI in Computers and Processors, 1990. ICCD '90. Proceedings, 1990 IEEE International Conference on

Conference_Location

Cambridge, MA

Print_ISBN

0-8186-2079-X

Type

conf

DOI

10.1109/ICCD.1990.130215

Filename

130215