Title :
Tritium-powered betavoltaic cells based on amorphous silicon
Author_Institution :
TRACE Photonics Inc., Albuquerque, NM, USA
Abstract :
Betavoltaic cells based on hydrogenated amorphous silicon nip drift junctions with ultrathin (5 nm) metal contact layers were developed for tritium-powered batteries. A large variety of amorphous silicon cells has been exposed to a tritium gas atmosphere for 46 days, and their performance has been studied in several time intervals. Initially, a short circuit current density of 637 nA/cm2, an open-circuit voltage of 457 mV, and an output power per unit area to a matched load of 136 nW/cm2 have been achieved with a 450 nm thick amorphous silicon nip drift junction. Rather large degradation of junction performance has been observed due to diffusion of a significant amount of tritium into the amorphous silicon film. Similar results have been obtained with an np AlGaAs junction, which yielded initially a short circuit current density of 937 nA/cm2, an open-circuit voltage of 467 mV, and an output power per unit area to a matched load of 259 nW/cm2. An indirect conversion battery based on tritium, a cathodoluminescent phosphor, and amorphous silicon, has also been constructed for comparison
Keywords :
amorphous semiconductors; cathodoluminescence; current density; elemental semiconductors; hydrogen; p-n junctions; phosphors; photovoltaic cells; radioisotopes; short-circuit currents; tritium; 450 nm; 457 mV; 46 d; 467 mV; 5 nm; AlGaAs; Si:H; T; a-Si:H betavoltaic cells; amorphous silicon; amorphous silicon cells; cathodoluminescent phosphor; diffusion; hydrogenated amorphous silicon nip drift junctions; indirect conversion battery; junction performance degradation; matched load; np AlGaAs junction; open-circuit voltage; output power per unit area; radioisotope batteries; short circuit current density; tritium gas atmosphere; tritium-powered batteries; tritium-powered betavoltaic cells; ultrathin metal contact layers; Amorphous silicon; Annealing; Batteries; Degradation; Power generation; Radioactive materials; Semiconductor thin films; Short circuit currents; Temperature; Voltage;
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
Print_ISBN :
0-7803-5772-8
DOI :
10.1109/PVSC.2000.916115