Title :
A Portable Low-Cost SEU Evaluation Board for SRAMs
Author :
Franco, Francisco J. ; Velazco, Raoul
Author_Institution :
TIMA Lab. (QLF Team), Grenoble
fDate :
Jan. 31 2007-Feb. 2 2007
Abstract :
This paper describes a field test system to evaluate the sensitivity of SRAMs to the natural radiation coming from the interaction of cosmic rays with the atmosphere. Unlike other experiments, this system is optimized to be portable and autonomous in order to allow making the development of the tests more flexible.
Keywords :
SRAM chips; logic testing; radiation effects; sensitivity; SEU evaluation board; SRAM; cosmic ray interaction; field test system; natural radiation effects; sensitivity; single event upset; Atmosphere; Cosmic rays; Field programmable gate arrays; Laboratories; Microprocessors; Neutrons; Performance evaluation; Random access memory; Single event upset; System testing; Cosmic rays; SRAMs; neutrons; single event effects; soft error rate;
Conference_Titel :
Electron Devices, 2007 Spanish Conference on
Conference_Location :
Madrid
Print_ISBN :
1-4244-0868-7
DOI :
10.1109/SCED.2007.384018
