• DocumentCode
    3033673
  • Title

    Applications for infrared imaging equipment in photovoltaic cell, module, and system testing

  • Author

    King, D.L. ; Kratochvil, J.A. ; Quintana, M.A. ; McMahon, T.J.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1487
  • Lastpage
    1490
  • Abstract
    Anomalous temperature distributions are often an indication of atypical behavior in a device under investigation. Portable infrared (IR) imaging systems (cameras) now provide a convenient method for measuring both absolute and relative temperature distributions on small and large components with a high degree of temperature and spatial resolution. This diagnostic tool can be applied during the development, production, monitoring, and repair of photovoltaic cells, modules, and systems. Planar objects with nearly uniform material composition are ideally suited for analysis using IR imaging. This paper illustrates investigations of localized shunting in cells, resistive solder bonds in field-aged modules, module bypass diode functionality, reverse-bias (hot spot) heating in modules, temperature distributions in flat-plate and concentrator modules, batteries during charging, and electronic component temperature in power processing equipment
  • Keywords
    infrared imaging; semiconductor device measurement; semiconductor device testing; solar cell arrays; solar cells; temperature distribution; thermal analysis; anomalous temperature distributions; concentrator modules; diagnostic tool; field-aged modules; flat-plate modules; infrared imaging equipment; module bypass diode functionality; photovoltaic cells; photovoltaic modules; photovoltaic systems; resistive solder bonds; Cameras; Composite materials; High-resolution imaging; Infrared imaging; Monitoring; Optical imaging; Photovoltaic cells; Production systems; Spatial resolution; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
  • Conference_Location
    Anchorage, AK
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-5772-8
  • Type

    conf

  • DOI
    10.1109/PVSC.2000.916175
  • Filename
    916175