DocumentCode
303386
Title
Multiresolution wavelet analysis based feature extraction for neural network classification
Author
Chen, C.H. ; Lee, G.G.
Author_Institution
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Dartmouth, MA, USA
Volume
3
fYear
1996
fDate
3-6 Jun 1996
Firstpage
1416
Abstract
In this paper we introduce a novel feature extraction scheme as a preprocessor for artificial neural network (ANN) classification. We have shown that the feature extraction scheme implemented via a non-stationary Gaussian Markov random field based on a multiresolution wavelet framework can provide effective features for both the ANN and fuzzy c-means (FCM) classification. In our experiment with natural textures and real world digital mammography, each region of the tested images is assumed to be a different class. A label field with each region or class being represented by the same gray-scale was then found by the backpropagation neural network and FCM clustering algorithm using the extracted discriminatory features. Further enhancement of the segmented result was achieved via Bayesian learning. The formulation of this maximum a posteriori (MAP) estimator was based on the Gibbs prior assumption which is especially appropriate for modeling real world mammograms. Although being estimated by constrained optimization, the MAP estimator can also be found from neural networks such as the Boltzmann and the mean-field-theory machines
Keywords
Bayes methods; backpropagation; diagnostic radiography; feature extraction; feedforward neural nets; image classification; optimisation; wavelet transforms; Bayesian learning; Gaussian Markov random field; Gibbs prior assumption; backpropagation neural network; digital mammography; feature extraction; fuzzy c-means clustering; maximum a posteriori estimator; multiresolution wavelet analysis; neural network classification; optimization; Artificial neural networks; Backpropagation; Clustering algorithms; Feature extraction; Gray-scale; Mammography; Markov random fields; Neural networks; Testing; Wavelet analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Neural Networks, 1996., IEEE International Conference on
Conference_Location
Washington, DC
Print_ISBN
0-7803-3210-5
Type
conf
DOI
10.1109/ICNN.1996.549107
Filename
549107
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