Multi-scale Monte Carlo simulation of soft errors using PHITS-HyENEXSS code system

Author

Abe, Shin-Ichiro ; Watanabe, Yukinobu ; Shibano, Nozomi ; Sano, Nobuyuki ; Furuta, Hiroshi ; Tsutsui, Masafumi ; Uemura, Taiki ; Arakawa, Takahiko

Author_Institution

Dept. of Adv. Energy Eng., Kyushu Univ., Fukuoka, Japan

fYear

2011

fDate

19-23 Sept. 2011

Firstpage

390

Lastpage

395

Abstract

We have proposed a multi-scale Monte Carlo simulation method of neutron induced soft errors by linking a particle transport code PHITS and a 3-D TCAD simulator HyENEXSS. An interface tool between PHITS and HyENEXSS is developed to generate the mesh structure optimized for an event where multiple secondary ions extending to arbitrary directions are generated simultaneously by neutron incidence on device. Using the interface tool, we have made it possible to perform the Monte Carlo calculation of soft error rates (SERs) based on event-by-event device simulation. The PHITS-HyENEXSS code system has been successfully applied to SER analyses for 65 nm, 45 nm, and 32 nm technology MOSFETs.

Keywords

MOSFET; Monte Carlo methods; electronic engineering computing; radiation effects; technology CAD (electronics); 3D TCAD simulator; MOSFET technology; PHITS particle transport code; PHITS-HyENEXSS code system; SER analysis; event-by-event device simulation; interface tool; mesh structure; multiple secondary ions; multiscale Monte Carlo simulation method; neutron incidence; neutron induced soft errors; size 32 nm; size 45 nm; size 65 nm; soft error rates; Alpha particles; Data models; Ions; MOSFET circuits; Monte Carlo methods; Neutrons; Production; HyENEXSS; Monte Carlo simulation; Neutron radiation effects; PHITS; Soft errors;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on

Conference_Location

Sevilla

ISSN

0379-6566

Print_ISBN

978-1-4577-0585-4

Type

conf

DOI

10.1109/RADECS.2011.6131413

Filename

6131413